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Fig. 7 | Journal of Genetic Engineering and Biotechnology

Fig. 7

From: Stress-induced expression of IPT gene in transgenic wheat reduces grain yield penalty under drought

Fig. 7

Grain yield for the three genotypes (WT, TR1, and TR4) grown under field conditions. Grain yield obtained in well-watered (WW) and water-deficit conditions applied during the critical period (WDCP) and grain filling (WDGF) in a San Juan (EXP4) and b Bordenave (EXP5). Mean ± S.D., n = 3 for each data point. Means sharing the same letters in columns do not differ (p< 0.1)

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